On the fly netlist compression in power analysis

ABSTRACT

A method for analyzing power in a circuit includes identifying equivalent elements in a source netlist representing the circuit. Abstract elements are formed combining the equivalent elements of the source netlist. A reduced netlist is formed, substituting the abstract elements in the reduced netlist for the collective equivalent elements in the source netlist. Metrics or properties associated with equivalent elements of the source netlist are combined and associated, in the reduced netlist, with the abstract elements. The reduced netlist can be analyzed with results equivalent to analyzing the source netlist.

BACKGROUND

The present disclosure relates to power analysis in a circuit, and morespecifically, to forming a compressed netlist to perform the analysis.

SUMMARY

According to embodiments of the present disclosure, a circuit includes aplurality of circuit cells and wires. A method to analyze electricalpower in the circuit includes a source netlist having circuit nodes thatcorrespond to cells in the circuit, and circuit edges that correspond towires in the circuit. The method includes forming a compressed circuitnode that combines, from circuit nodes within the source netlist, afirst circuit node and at least one second circuit node that have a nodeequivalence. The method further includes forming a first compressedcircuit edge that combines, from circuit edges within the sourcenetlist, a first circuit edge and at least one second circuit edge thathave an edge equivalence.

Embodiments of the method form a reduced netlist that substitutes thecompressed node for the first circuit node and second circuit nodes, andsubstitutes the first compressed edge for the first circuit edge andsecond circuit edges. Embodiments further associate a lumped node metricwith the compressed node, in the reduced netlist, that combines a nodemetric associated with each of the first circuit node and the secondcircuit nodes. A first lumped edge metric is associated with the firstcompressed edge, in the reduced netlist, that combines a first edgemetric associated with each of the first edge node and the secondcircuit edges.

Some embodiments of the present disclosure form a second compressed nodethat combines a third circuit edge and a third circuit node. The thirdcircuit edge is a circuit edge from a group consisting of the firstcompressed circuit edge and at least one fourth circuit edge included inthe source netlist. The third circuit node is a circuit node from agroup consisting of the compressed circuit node and at least one forthcircuit node included in the source netlist. The second compressed nodeis formed based on the third circuit edge and the third circuit nodehaving the same output states when receiving the same input states andheld in a static state of operation.

In some embodiments of the present disclosure, the node equivalence is alogical or a functional equivalence. Logical equivalence comprises thefirst circuit node and one combination of the second circuit nodeshaving the same operational activity, the first circuit node and asecond combination of the ne second circuit nodes having the same inputand output states when held in a static state of operation, and thefirst circuit node and a third combination of the second circuit nodesbeing cloned nodes that receive a common signal source. Functionalequivalence comprises the first circuit node and the second circuitnodes producing the same output states when each receive of the sameinput states.

In some embodiments, analyzing power in the circuit determines dynamicpower, leakage power, or short-circuit power; the lumped node metric andnode metric are device capacitance, cross-over current capacitance, orleaking width; and the first lumped edge metric and the first edgemetric are wire capacitance.

According to some embodiments of the present disclosure, a computerprogram product includes instructions executable by a computing deviceto perform methods of the disclosure. In some embodiments, a computersystem includes a source netlist according to the disclosure, aninterface to receive the source netlist, and a processor coupled to theinterface. The processor is configured to execute instructions toperform methods of the disclosure and to form a reduced netlist. Inembodiments the instructions are, optionally, stored in a memorycommunicatively coupled to the processor. Embodiments, optionally, storethe reduced netlist in the memory.

The above summary is not intended to describe each illustratedembodiment or every implementation of the present disclosure.

BRIEF DESCRIPTION OF THE DRAWINGS

The drawings included in the present application are incorporated into,and form part of, the specification. They illustrate embodiments of thepresent disclosure and, along with the description, serve to explain theprinciples of the disclosure. The drawings are only illustrative ofcertain embodiments and do not limit the disclosure.

FIG. 1A is a block diagram illustrating two example reduced netlists,according to embodiments of the disclosure.

FIG. 1B is a block diagram illustrating an example of a third reducednetlist, according to embodiments of the disclosure.

FIG. 2 is a block diagram illustrating an example of a fourth reducednetlist, according to embodiments of the disclosure.

FIG. 3 is a block diagram illustrating an example of a fifth reducednetlist, according to embodiments of the disclosure.

FIG. 4A is a block diagram illustrating an example of a sixth reducednetlist, according to embodiments of the disclosure.

FIG. 4B is a block diagram illustrating an example of a seventh reducednetlist, according to embodiments of the disclosure.

FIG. 5 is a flowchart that illustrates an example method to form areduced netlist, according to embodiments of the disclosure.

FIG. 6A is a flowchart that illustrates an example method to identifyequivalent nodes and edges in a netlist, according to embodiments of thedisclosure.

FIG. 6B is a flowchart that illustrates a second example method toidentify equivalent nodes and edges in a netlist, according toembodiments of the disclosure.

FIG. 6C is a flowchart that illustrates a third example method toidentify equivalent nodes and edges in a netlist, according toembodiments of the disclosure.

FIG. 7 is a block diagram illustrating a computer system, according toembodiments of the disclosure.

While the invention is amenable to various modifications and alternativeforms, specifics thereof have been shown by way of example in thedrawings and will be described in detail. It should be understood,however, that the intention is not to limit the invention to theparticular embodiments described. On the contrary, the intention is tocover all modifications, equivalents, and alternatives falling withinthe spirit and scope of the invention.

DETAILED DESCRIPTION

Aspects of the present disclosure relate to analyzing characteristics ofelectronic circuits having a plurality of interconnected circuit cells.More particular aspects relate to identifying equivalent cells andinterconnections in a source netlist and combining, or “compressing”,the equivalents into abstract components that substitute, in a reducednetlist, for the source netlist equivalent components. Analysis of thereduced netlist can produce a result equivalent to analysis of thesource netlist. While the present disclosure is not necessarily limitedto such applications, various aspects of the disclosure may beappreciated through a discussion of various examples using this context.

Electronic circuits or, for example, logic circuits formed of electroniccomponents can include particular circuit cells. As used herein,“electronic circuit”, or “circuit” (where not otherwise qualified orcharacterized) refers to any circuit comprising interconnectedelectronic components, including logic circuits implemented usingelectronic components. In embodiments, an electronic or a logic circuitcell (hereinafter, “circuit cell”) can be, or function as, (for example)a logic function, such as an AND/NAND, OR/NOR, or inverter element orgate; a clock; a memory cell, a latch or latch tree, or an arithmeticunit; or, a combination of the foregoing. A circuit cell can be (forexample) a transistor, a capacitor, a resistor, or a wire; a clockgeneration circuit or a clock buffer; or, a combination of theforegoing. In some embodiments, logic cells be synthesized, orimplemented, as electronic cells or components.

In some embodiments, a particular combination of circuit components, orcells, can comprise a circuit design block, or circuit “book”. Forexample, a circuit book (hereinafter, “book”) can be a combination oftransistors or electronic components, and/or logic cells, configured ina particular manner to perform a particular electronic or logic functionwithin a circuit. A book can be included, for example, in a “library” ofcommonly used circuit design blocks (e.g., books). A circuit can includeone, or multiple, instance of a particular book, and a particular bookcan comprise a cell within a circuit.

A circuit can be analyzed for a variety of properties, which caninclude, for example, analysis of power properties or behaviors of thecircuit or a particular sub-circuit, or a particular cell orinterconnection (e.g., a wire) between cells, within the circuit. Forexample, an electronic circuit can be analyzed to determine AC or DCpower properties, such as dynamic power, leakage power, or short circuitpower. Dynamic power in a circuit can be, for example, power consumed,or required, in relation to transistor switching (e.g., transitioningbetween high and low voltages) while a circuit is operating.

Leakage power can be, for example, power lost to a combination oftransistors that implement a particular circuit function. For example, alogic inverter can be formed of two transistors (e.g., a top and bottomtransistor) and the inverter can be designed such that in a particularinput state (e.g., logical 1 or 0, corresponding, respectively, to ahigh or low voltage) one of the transistors in the inverter (e.g., the“top” transistor) is “on” and the other (e.g., the “bottom” transistor)is “off”. Even though the input state to the inverter, and itscorresponding output state, is stable (not changing), when the circuitis operating (i.e. power supply to the circuit is maintained) theinverter consumes “leakage” power corresponding to the power consumed bythe “off” transistor within the inverter.

A combination of transistors, such as the two (top and bottom)transistors forming the example inverter, can also produce a “shortcircuit” power. Short circuit power can be power consumed in relation toan input state (e.g., a high voltage) to the two transistors changing(e.g., to a low voltage). As the transistors respond to the changinginput state, the changing input state can have an “input pin slew”, orramping up or down (versus, for example, an instantaneous change), ofthe input state(s). Such an input pin slew can produce a temporary statein which both transistors are simultaneously operating and theadditional power consumed while in this state can be referred to as“short circuit” power.

Analyzing power properties of electronic circuits can incorporateparticular operating properties of a cell or wire, such as capacitanceor “leaking width”. A circuit cell or wire can be associated with, orhave, a particular electrical capacitance. For example, a circuit cellcan have a “gate” (e.g., transistor device) capacitance associated withthe transistor(s) forming, or included in, the cell. A wire can have a“wire capacitance” derived, for example, from its material (e.g., aparticular metal type) or geometry (e.g., its length or cross-section,or volumetric combination thereof).

Leakage power (which can be a component of DC power) of a circuit cellcan be associated with a “leakage width” of the cell. In someembodiments, leakage width can be derived, for example, from the totalphysical width of the transistor and the fraction of time that thetransistor is off (inactive) with respect to the full time operation ofthe circuit is simulated in an analysis. For example, the fraction oftime, or “duty cycle” that a transistor (e.g., the top transistor) in atwo-transistor inverter cell is inactive (e.g., in an analysis) can be50%, if the design of the cell is such that the transistors arecomplementary to each other.

The leakage width can also be associated with the geometric width of thegate of that transistor, such that a leakage width for a gate can be amultiple of its duty cycle and its gate (e.g., transistor device ordevices) width, and leakage width of the cell can be the combinedleakage width of the two transistors. For example, leakage width of theinverter cell can be the gate width of the top transistor, times itsduty cycle (e.g., 50%), plus the gate width of the bottom transistortimes the duty cycle of the bottom transistor (e.g., 50%).

A circuit can be represented as a “netlist”, which can be a type ofgraph in which netlist nodes represent circuit cells and netlist edgesrepresent circuit wires that interconnect the nodes. However, it will beunderstood by one of ordinary skill in the art that “node” is anabstraction of a component of a circuit, and “edge” is an abstraction ofa wire interconnecting components of a circuit. In embodiments, anetlist can be formally a graph of abstract nodes and edges.Alternatively, in an embodiment can be a graph incorporating anotherrepresentation of a cell and/or wires such as, for example, adescription of a cell, and/or cell interconnections, used to synthesizethe electronic components of the cell and their electronicinterconnections, or to fabricate the cell as a semiconductor circuit.Accordingly, for purposes of illustrating the disclosure, herein theterms “node” and “cell”, are used interchangeably, and the terms “edge”and “wire” are used interchangeably, with respect to netlistsrepresenting a circuit.

A netlist can be analyzed to determine particular properties orbehaviors of the circuit, or particular cells and/or wires forming thecircuit. A power analysis, for example, can determine power propertiesof the circuit (e.g., dynamic (e.g., AC), leakage (e.g., DC), or shortcircuit power) by analyzing the electrical behavior of the nodes (e.g.,cells) and edges (e.g., wires) in the netlist. A computer program, forexample, can perform power analysis of a circuit, represented as (forexample) a netlist, by analyzing the electrical behavior of the cellsand wires in the netlist in response to particular stimuli (e.g., aseries of inputs) or conditions (e.g., particular dynamic or “corner”voltages or temperatures).

However, modern electronic and logic circuits can be composed of manythousands, or even millions, of electronic or logic components or cellsin complex configurations or arrangements. A netlist representing such acircuit, correspondingly, can be composed of many thousands, or evenmillions, of nodes (e.g., cells) and edges (e.g., wires) in complexconfigurations or arrangements. Manually analyzing such circuits isimpractical, and computer analysis, for such large-scale circuit (or,netlists) can require a large number of very powerful computers orrequire an exceedingly large amount of time.

A “reduced” netlist, can be formed by substituting, for nodes and/oredges in a “source” netlist, an abstract (e.g., “compressed”), nodesand/or edges that in some manner combines nodes and or edges in a sourcenetlist. For example, to perform power analysis of a circuit, nodesand/or edges within a source netlist can be combined into an abstractnode and/or an abstract edge according to particular criteria. However,it can be necessary, in a power analysis, then to create a “power model”of the abstract nodes in the reduced netlist, specific to the particularpower analysis desired, and to create such a power model of each suchabstract node, separate from performing the power analysis. This canrequire performing multiple, separate or independent, methods orprocessing passes, of a source and/or reduced netlist to prepare orperform a circuit analysis.

In electronic circuits it can be possible to identify logically orfunctionally equivalent nodes (e.g., cells) and/or edges (e.g., wires)within a source netlist representing the circuit. In embodiments,“logically equivalent” nodes in a netlist can be, for example, nodesthat have the same operational activity, are held in the same staticstate of operation, or that are replicas, or clones, of each other thatsink (e.g., receive) a common signal source. Nodes can have the sameoperational activity, for example, if the nodes perform the samefunction (e.g., electrically buffer a clock signal), or as a combinationof nodes, produce the same state at the output of the combination, forthe same input to the combination of nodes, as another node. Thedisclosure includes example netlists that include nodes having variousconditions of logical equivalence.

In embodiments, nodes in a netlist that have the same function or that,for the same logical input states, produce the same logical outputstate, can be “functionally equivalent”. For example, inverters, ANDgates, NAND gates, OR gates, NOR gates, or latches can each befunctionally-equivalent of one another (i.e., one inverter can befunctionally-equivalent to another, one inverter can befunctionally-equivalent to a series connection of three inverters, oneAND gate be functionally-equivalent to another, etc.).

It can be possible, further, to identify logically equivalent edgeswithin a netlist. For example, input and/or output edges (e.g., wires)that connect to logically or functionally equivalent nodes (e.g.,cells), or that connect a series of nodes that cancel each other (e.g.,logically, such as an even number of inverters in series) can belogically equivalent.

As used herein, “equivalent”, with respect to nodes and/or edges of anetlist, refers to nodes and/or edges that are either logicallyequivalent or are functionally equivalent in a source netlist. Inembodiments of the disclosure, identifying equivalent nodes (e.g.,cells) and/or edges (e.g., wires) in a source netlist, and combining(e.g., compressing) these into abstract nodes and/or edges to form areduced netlist, can be performed “on-the-fly”. For example, a reducednetlist can be formed of abstract nodes and/or edges while performingpower analysis of a source netlist, and without requiring multiple orseparate methods or passes to process the source netlist or perform theanalysis.

Analyzing a reduced netlist (e.g., to perform power analysis) canproduce results equivalent to analysis of the source netlist for thesame particular properties, while requiring less computing power and/ortime to perform the analysis. Accordingly, embodiments of the presentdisclosure include a method to identify and combine equivalent nodes(e.g., cells) of a source netlist into an abstract node, and equivalentedges (e.g., wires) of the source netlist into an abstract edge, to forma reduced netlist. Analysis of the circuit can then be performed usingthe reduced netlist.

An abstract node or edge in a reduced netlist can combine, or “lump”(e.g., sum), particular operating parameters or metrics of the sourcenetlist equivalent nodes and/or edges. For example, an abstract node oredge can lump parameters such as capacitance (e.g., capacitance of awire or device capacitance of a transistor, transistor gate, or otherelectronic component comprising a node), cross-over (or, “shootthrough”) current capacitance and/or leakage width of a transistor (or,other electronic) device—of equivalent nodes and/or edges in the sourcenetlist. A reduced netlist can incorporate the abstract nodes and edges,and their lumped parameters or metrics, in substitution for theequivalent nodes and edges of the source netlist, and their individualparameters or metrics. As used herein, “reduced netlist” refers to anetlist that substitutes abstract nodes (e.g., circuit cells) and edges(e.g., circuit wires) for the equivalent nodes (e.g., cells) and/oredges (e.g., wires) in a source netlist, and in which the abstract nodesand edges lump operating parameters or metrics of the source netlistequivalent nodes and edges, respectively.

In embodiments it is possible to compress nodes across a combination ofnodes such that the function of the combination of nodes is preserved.For example, given particular inputs a compressed node can produce thesame output(s), under particular operating conditions, as theun-compressed combination of nodes in the source netlist given thosesame inputs and same operating conditions. The compressed node (and,optionally, associated abstract edges) can substitute in the reducednetlist for the uncompressed source netlist nodes. In alternativeembodiments, a reduced netlist can include compressed nodes (and,optionally, associated abstract edges) combining only equivalent (e.g.,logically equivalent) nodes within a combination of source netlistnodes. FIGS. 1A and 1B illustrate example circuits that have nodes thatcan be combined in reduced netlists in which nodes are combined (e.g.,merged) across a combination of nodes (reduced netlist 100B) or,alternatively, in which only logically equivalent nodes are combined(reduced netlist 100C).

In FIG. 1A, source netlist 100A represents a circuit (which,alternatively, can be a sub-circuit of a larger circuit) comprised ofbooks connected through inverters. Book 10A is connected to book 10Ethrough inverters 10B-10D. The series of inverters 10B through 10Dresult at output 10J in an inversion logic state of input 10F such that,as a series of nodes, they can be functionally equivalent to a singleinverter node. Accordingly, the three inverters (10B-10D) can becompressed into abstract inverter 11B, substituting for source netlistseries of inverters between book 10A and book 10E in reduced netlist100B. Correspondingly, the inverter outputs 10G, 10H, and 10J can becompressed into abstract output edge 11A in netlist 100B, substitutingin netlist 100B for source netlist 100A output edge 10J.

For purposes of, for example, performing power analysis of the circuit,abstract inverter 11B can be assigned, for example, a lumped capacitance(e.g., lumped gate and/or cross-over current capacitance), or a leakingwidth, combining the individual capacitances, and/or leaking widths,respectively, of inverters 10B-10D. For example, as illustrated in FIG.1A, in some embodiments the lumped capacitance and/or leaking width, ofabstract inverter 11B can be the sum of the capacitances, and/or leakingwidth, respectively, of inverters 10B, 10C, and 10D. In otherembodiments, the capacitance and/or leaking width, of an abstract nodecan be determined according to other combinations of the individualsource netlist node capacitances and/or leaking width (e.g.,mathematical formulas that include cell or component geometries or othersuch properties).

In netlist 100A output edge 11A can further be assigned, for example, alumped capacitance. For example, edge 11A can have a lumped capacitancethat is the sum of the capacitances of output edges 10G, 10H, and 10J.In other embodiments, the capacitance of an abstract edge can bedetermined according to other combinations of the individual sourcenetlist node and/or edge capacitances (e.g., mathematical formulas thatinclude wire, cell, or component geometries or other such properties).

FIG. 1A further illustrates an alternative example netlist, 100C, whichcan be formed from source netlist 100A by combining nodes that have alogical equivalence. Netlist 100C can be formed, for example, to accountfor the effect of input pin state on leakage power of a node in a poweranalysis of the source netlist circuit. In netlist 100A, the logicalvalue of outputs 10G in the inverted logic state of input 10F. As input10F passes through two inverters (10B and 10C), the logical state of10H, as an input to inverter 10D, is the same as that of 10F andinverter 10D has the same logic function as 10B.

Accordingly, inverters 10B and 10D can be logically equivalent and tocombined to form compressed node 11D in netlist 100C. Correspondinglogically equivalent output edges 10G and 10J can be compressed intoabstract edge 11C, substituting in netlist 100C for source netlist 100Aoutput edge 10G. In netlist 100C, abstract node 11D presents the sameinput to book 10E and inverter 10C as series of inverters 10B through10D in source netlist 100A.

For purposes of, for example, performing power analysis of the circuit,abstract inverter 11D in netlist 100C can be assigned, for example, alumped capacitance (e.g., lumped gate or cross-over currentcapacitance), or leaking width, combining the individual capacitances,and/or leaking width, respectively, of netlist 100A inverters 10B and10D. In netlist 100C output edge 11A can be assigned, for example, alumped capacitance combining the capacitances of netlist 100A outputedges 10G and 10J.

In embodiments the lumped capacitance and/or leaking width, of abstractinverter 11D can be, for example, the sum of the capacitances, and/orleaking width, respectively, of inverters 10B and 10D, and output edge11C can have a lumped capacitance that is, for example, the sum of thecapacitances of output edges 10G and 10J. In alternative embodiments,the lumped capacitance and/or lumped leaking width, of an abstract nodeand/or edge can be determined according to other combinations of theindividual source netlist node and/or edge capacitances and/or leakingwidths (e.g., mathematical formulas that include cell or componentgeometries or other such properties).

FIG. 1B illustrates an example circuit and in which a series ofcomponents functionally cancel each other to allow combining thesecomponents into an abstract edge. Source netlist 120A represents thecircuit and includes two inverters, 12B and 12C, connected in seriesbetween books 12A and 12D. The series of inverters 12A and 12D presentthe same logic state input value to book 12D (on edge 12G) as is outputfrom book 12A on edge 12E. Accordingly, inverters 12B and 12C arefunctionally equivalent to an edge and, in combination with theirassociated edges 12E, 12F, and 12G, can be compressed (in someembodiments) into abstract edge 12H, in substitution in netlist 120B forthe series of inverters and edges of netlist 120A between books 12A and12D.

Edge 12H can further be assigned, for example, a lumped capacitance. Forexample, edge 11A can have a lumped capacitance that is the sum of thecapacitances (e.g., gate and/or cross-over current capacitance) of edges10F, 10G, and 10H. In other embodiments, the lumped capacitance of anabstract edge can be determined according to other combinations of theindividual source netlist node and/or edge capacitances (e.g.,mathematical formulas that include wire, cell, or component geometriesor other such properties).

While the examples of FIGS. 1A and 1B describe lumping capacitanceand/or leaking widths, it would be apparent to one of ordinary skill inthe art to lump other metrics, parameters, or properties of nodes andedges (e.g., other metrics or properties associated with analyzingelectrical power in a circuit) in forming a netlist with abstract nodesand edges replacing collections of logically equivalent nodes (e.g.,cells) and./or edges (e.g., wires) included in a source netlist.

FIG. 2 illustrates an example circuit represented as source netlist 200,which can be represented as reduced netlist 210 by combining equivalentnodes and edges of netlist 200 into abstract nodes and edges to includein reduced netlist 210. For purposes of illustrating the disclosure, butnot limiting to embodiments, nodes in netlist 200 include inverternodes, 20A-20D and 24A-24D, and book nodes 2A-2D, and edges 26A-26E and22A-22D that connect the inverter and book nodes. Each of the invertersand book nodes can have a property or metric, such as gate and/orcross-over current capacitance and/or leaking width. Edges in netlist200 can represent wires in the circuit having, for example, a wirecapacitance. Netlist 210 can be analyzed to determine properties orbehaviors of the circuit represented as netlist 200, for example toanalyze power characteristics of the circuit.

FIG. 2 illustrates an example of forming a reduced netlist by combining(e.g., merging) functionally equivalent nodes across a combination ofnodes in the source netlist. In example source netlist 200, each ofinverters 20A-20D perform the same function; that is, each effectivelyinverts the logic state of edge 26A and so are functionally equivalent.Each of inverters 24A-24D perform the same function; that is, eacheffectively inverts the logic state of edge 22A and so are functionallyequivalent.

Accordingly, as shown in the example reduced netlist 210 of FIG. 2,inverters 20A-20D can be merged into abstract inverter node 28A, andinverters 24A-24D can be merged into abstract inverter node 28B. Edges26B-26E, in source netlist 200, have the same logic state as edge 26Aand so are equivalent; similarly, edges 22B-22D have the same logicstate as edge 22A and so are equivalent. Correspondingly, equivalentedges 26A-26E can be merged into abstract edge 28C, and equivalent edges22A-22D can be merged into abstract edge 28D.

For purposes of, for example, performing power analysis of the circuit,abstract inverters 28A and 28B in netlist 210 can be assigned, forexample, a lumped capacitance (e.g., lumped gate or cross-over currentcapacitance), or leaking width, combining the individual capacitances,and/or leaking width, respectively, of corresponding equivalent nodes innetlist 200.

In embodiments the lumped capacitance and/or leaking width, of abstractnodes and/or edges can be the sum of the capacitances and/or leakingwidths of their corresponding source netlist equivalent nodes and/oredges. For example, in reduced netlist 210 abstract node 28A can beassigned a lumped node capacitance (e.g., device or gate, and/orcross-over current, capacitance), and/or leaking width, that is the sumof the node capacitance of each of netlist 200 inverters 20A-20D andabstract node 28B can be assigned a lumped node capacitance, and/orleaking width, that is the sum of the node capacitance of each ofnetlist 200 inverters 24A-24D. In some embodiments, the nodecapacitances, and resulting lumped capacitance, can be summed forvarious voltage threshold (VT) values, for example to separatecross-current components of the capacitance.

In reduced netlist 210, edge 28C can be assigned a lumped wirecapacitance that is the sum of that off each of edges 26A-26E and edge28D can be assigned a lumped wire capacitance that is the sum of thatoff each of edges 22A-22D. In alternative embodiments, the lumpedcapacitance and/or lumped leaking width, of an abstract node and/or edgecan be determined according to other combinations of the individualsource netlist node and/or edge capacitances and/or leaking widths(e.g., mathematical formulas that include cell or component geometriesor other such properties).

While not shown in the example of FIG. 2, cells in a netlist thatrepresent a combination of components, such as a book, can also beequivalent and the equivalent books can be merged into an abstract bookfor inclusion in a reduced netlist. For example, in netlist 200, books2B and 2D are connected by a series of an odd number of inverters suchthat both books 2B and 2D receive the inverted logic state of edge 26A.If books 2B and 2D perform the same logic function (for example), theycan be equivalent with respect to netlist 200 and can be merged into asingle, abstract book (not shown), such as an abstract book combiningbooks 2B and 2D in netlist 210 as connected to edge 28D as an input.Correspondingly, parameters (e.g., capacitances or leaking width) of thesource netlist books can be combined (e.g., summed) to assign a lumpedvalue to the abstract book.

It would be apparent to one of ordinary skill in the art that a sourcenet list can include equivalent nodes of a variety of compositions and,according to the disclosure, be combined in a reduced netlist into anabstract node. It would be further apparent to one of ordinary skill inthe art that such an abstract node in a reduced netlist can be assigneda property combining corresponding properties of their correspondingequivalent source netlist nodes of a variety of compositions.

FIG. 3 illustrates an example source netlist, 300, in which examplenodes (AND gates, in the example of FIG. 3) are logically equivalentbased on being operated, for purposes of analyzing the circuit, in astatic state with the same inputs states. A particular combination ofcells in a circuit can be in a static state in, for example, particularmodes or times of operation of a circuit. For example, a circuit caninclude particular cells that change state only in test modes of circuitbut are isolated (e.g., gated, or not clocked) from dynamic statechanges (e.g., switching) in other (e.g., normal operating) modes ofcircuit operation. In some embodiments, cells that, for example, are ina static state and that share the same input states (e.g., logically oneor zero), and/or their input edges, can be logically equivalent.

In embodiments a reduced netlist can be formed that combines nodes fromthe source netlist that are logically equivalent as in a static stateand having the same input states during operating modes of the circuitto be analyzed (e.g., during dynamic power analysis). For example,reduced netlist 320 can be formed by combining such logically equivalentnodes and edges of source netlist 300.

In the example of FIG. 3, logical AND gates 302, 304, and 306 in sourcenetlist 300 can be in a static state in certain modes of operation(e.g., an operational mode) of a circuit that includes them. Forexample, control book 310 can establish a static state of AND gates 302and 304, such as by providing a static logical “1” input value at allinputs, 30A-30D, to gates 302 and 304. As the outputs of AND gates 302and 304 are inputs to AND gate 306, maintaining a static state of ANDgates 302 and 304 correspondingly maintains a static state, with thesame static input (30E and 30F) states, of AND gate 306. Accordingly,AND gates 302, 304, and 306 can be logically equivalent, inputs 30A-30Fcan be logically equivalent, and outputs 312 and 30G can be logicallyequivalent.

In embodiments, nodes, and/or their respective input and output edges,that are static and have the same input and output values can be mergedinto a single output abstract edge, 31A, at the output of control book310, as in the example reduced netlist 320 of FIG. 3. For purposes of,for example, performing power analysis of the circuit, abstract edge 31Ain netlist 320 can be assigned, for example, a lumped capacitance (e.g.,lumped gate and/or cross-over current capacitance) and/or leaking width,combining the individual capacitances, and/or leaking widths,respectively, of AND gates 302, 304, and 306, and input and output edges312 and 30A-30G.

In embodiments lumped capacitance and/or leaking widths of compressedabstract edge 31A in netlist 310 can be, for example, the sum of thecapacitances, and/or leaking widths, respectively, of the individualnetlist 300 AND gates, and their respective inputs and outputs. Inalternative embodiments, the lumped capacitance and/or lumped leakingwidth, of an abstract node and/or edge can be determined according toother combinations of the individual source netlist node and/or edgecapacitances and/or leaking widths (e.g., mathematical formulas thatinclude cell or component geometries or other such properties).

In alternative embodiments (not shown), logically equivalent nodes(e.g., AND gates 302, 304, and 306) can be compressed into one or moreabstract nodes, and the logically equivalent input and/or output edgesof the nodes can be compressed into abstract input and output edges ofthe node(s), respectively. A reduced netlist can be formed with such anabstract node and edge(s), for example, to account for the effect ofinput pin state on leakage power in a power analysis of a circuit. Toillustrate, in an alternative embodiment, netlist 320 can have a single,abstract AND gate (not shown), merging AND gates 302, 304 and 306 andconnected by an abstract input edge from control block 310. The abstractAND gate can be assigned a lumped capacitance combining that of thosesource netlist AND gates 302-306. An abstract input edge connecting theabstract AND from gate control block 310 can be assigned a lumpedcapacitance combining that of netlist 300 edge 312 and the input edgesto gate 306. The abstract AND gate can retain output edge 30G from ANDgate 306, and be assigned the edge capacitance of edge 30G.

It would be apparent to one of ordinary skill in the art that thecompressed abstract node(s) and/or edge(s) can be assigned lumpedcapacitances and/or leaking widths, or other parameters of interest inan analysis of the circuit, by combining the corresponding parameters ofthe source netlist nodes and/or edges.

FIG. 4A illustrates an example source netlist (400) in which logicallyequivalent nodes are cloned cells (e.g., logic gates or design books)that sink a common signal source. A particular set or combination ofcells in a circuit can be replicas (e.g., “clones”) of another identicalset or combination of cells in the circuit. For example, synthesizing alogic circuit from a design description (e.g., a register transfer leveldescription) can generate a combination of identical logic units (e.g.,books or logic gates) that are identical, or “clones”, and the clonedlogic units can share a common source input. In some embodiments, clonedcells in a netlist can have a common naming schema, such that ananalysis program can identify the cloned cells, for example, by sharedcomponents of their cell names in a netlist (e.g., cell_X_100,cell_X_101, cell_X_102, and so forth).

In embodiments, cloned nodes in a circuit that receive (or, “sink”) thesame input source (or, logically or functionally the same input—forexample a common source signal received through different electricalbuffers) can be logically equivalent. In alternative embodiments, cellsmay not be clones, but can be functionally equivalent. A reduced netlistcan be formed that merges equivalent cloned nodes, and/or functionallyequivalent nodes, and edges into abstract nodes and edges in the reducednetlist. For example, reduced netlist 410 can be formed by mergingequivalent cloned and/or functionally equivalent nodes and edges ofsource netlist 400.

In FIG. 4A, source netlist 400 can represent, for example, a clockingcircuit having a global clock generator (GCG) whose outputs aredistributed, in parallel, to local clock buffers (LCBs), which in turnclock latch (or flip-flop) cells. In source netlist 400, clock output40A of GCG 4A is distributed as parallel inputs to LCBs 4B and 4C. LCBs4B and 4C provide clock signals 40B and 40C, respectively, to latchcells 4D and 4E.

LCBs 4B and 4C can be logically equivalent cloned cells. For example,circuit synthesis of the example clock distribution tree can select thesame cell design to instantiate LCB 4B and LCB 4C, which also receivesGCG clock output, 40A (and, in some embodiments, additional LCBs sharingGCG 4A clock output 40A). Latch cells 4D and 4E can include other inputs(not shown), such as, for example, one or more input states to storewithin the latch cell. In embodiments, LCB 4C can be a clone (e.g., areplicated instance) of the cell (or, cell design) that forms LCB 4B. Inother embodiments, latches 4D and 4E may not be logically equivalent butcan yet be functionally equivalent (e.g., given the same inputs, underparticular operating condition or modes, latch 4D and 4E produce thesame output, or outputs.

An analysis of netlist 400 can identify LCBs 4B and 4C as cloned cellsthat share GCG 4A clock output 40A as inputs and. accordingly, determinethat LCBs 4B and 4C are logically equivalent. LCBs 4B and 4C can bemerged into abstract LCB 4F to include in reduced netlist 410. Furtheranalysis of source netlist 400 can determine that latches 4D and 4E arelogically, or functionally, equivalent and can merge latches 4D and 4Einto abstract latch 4G to include in reduced netlist 410.

For purposes of, for example, performing power analysis of the circuit,abstract LCB 4F can be assigned, for example, a lumped capacitance(e.g., lumped gate and/or cross-over current capacitance) and/or leakingwidth, combining the individual capacitances, and/or leaking widths,respectively, of LCBs 4B and 4C. Abstract latch 4G can be assigned, forexample, a lumped capacitance (e.g., lumped gate and/or cross-overcurrent capacitance) and/or leaking width, combining (e.g., summing) theindividual capacitances, and/or leaking widths, respectively, of latches4D and 4E.

Input and/or output edges associated with the LCBs and latches can belogically equivalent and can be merged into abstract input or outputedge (respectively) in netlist 410. For example, input edges to LCBs 4Band 4C can be merged to form abstract edge 41A as the input edge toabstract LCB 4F, and netlist 400 edges 40B and 40C can be merged to formabstract edge 41B as the input edge to abstract latch 4G. Abstract edge41A can be assigned a lumped edge metric such as, for example, thecapacitance of edge 40A, and abstract edge 41B can be assigned a lumpededge metric such as, for example, a lumped capacitance combining (e.g.,summing) that of edges 40B and 40C.

FIG. 4B illustrates an alternative example embodiment of a sourcenetlist in which some nodes are clones and other nodes are notequivalent and cannot be merged. Source netlist 420 represents a clockgenerator circuit similar to that of source netlist 400 in FIG. 1A. GCG4H provides a clock output edge 42A that is input (also as 42A) inparallel to LCBs 4J and 4K. LCB 4J provides the clock signal from edge42A on edge 42B as an input to latch 4M. LCB 4K provides the clocksignal from edge 42A on edge 42C as an input to latch 4N. As illustratedin example reduced netlist 430, LCBs 4J and 4K can be clones and can bemerged into abstract LCB node 4P. Abstract edge 43A, in reduced netlist430, can be formed as the merged combination of the input edges 42A toLCBs 4J and 4K.

However, in the example of source netlist 420, latches 4M and 4N are notequivalent and so cannot be merged into an abstract latch node inreduced netlist 430. On the other hand, edges 42B and 42C can beequivalent (for example, as providing equivalent buffered clock inputsto latches 4M and 4N, respectively) and can be merged into an abstractedge 43B. As latches 4M and 4N cannot be merged, abstract edge 43Bprovides a parallel input, in netlist 430, to each of latches 4M and 4N.

As further illustrated in the example of FIG. 4B, abstract LCB node 4Pcan be assigned a lumped node metric that combines node metrics of eachof LCBs 4J and 4K. For example, LCB 4P can be assigned, or associatedwith, a device capacitance (e.g., the gate capacitance of a transistordevice) and the lumped node capacitance can be the sum of the device(or, gate) capacitances of LCBs 4J and 4K. Similarly, abstract edge 43Bcan be assigned a lumped edge metric that combines edge metrics of eachof edges 42B and 42C. For example, abstract edge 43B can be assigned, orassociated with, a wire capacitance and the lumped wire capacitance canbe the sum of the wire capacitances of edges 42B and 42C. Similarly,abstract edge 43A can be assigned, or associated with, the wirecapacitances of source netlist 420 edges 42A.

The examples of FIG. 4A and FIG. 4B illustrate lumped node and edgemetrics computed as the sums of source netlist equivalent node and edgemetrics. However, it would be apparent to one of ordinary skill in theart that, in alternative embodiments, the lumped capacitance and/orlumped leaking width, of an abstract node and/or edge can be determinedaccording to other combinations of the individual source netlist nodeand/or edge capacitances and/or leaking widths (e.g., mathematicalformulas that include cell or component geometries or other suchproperties).

FIG. 5 illustrates an example method 500 to combine equivalent nodes(cells) and edges (wires) included in a source netlist to form a reducednetlist. For purposes of illustration, but not limiting to embodiments,the method is described as performed by a circuit analysis program(hereinafter, “analysis program”, or “program,”), in which electroniccomponents (or, books) or logic cells of a circuit are nodes, and wiresare edges, in the source netlist.

An analysis program can be, for example, a program that can model orsimulate the behavior of a circuit to analyze various properties (e.g.,electrical properties) of the circuit or elements thereof. For example,an analysis program can determine power properties (e.g., dynamic, shortcircuit, or leaking power) of a circuit, or sub-circuits or componentsof a circuit. An analysis program can analyze the circuit to determine,for example, dynamic, leakage, or short circuit power behavior orconsumption. An analysis program can analyze a circuit by stimulatingthe circuit with particular input values (e.g., voltages, voltagethreshold, or logic values) and the analysis program can monitor theresponse of particular components (e.g., circuit cells) of the circuit,or the circuit as a whole (e.g., total power consumption, or a resultingvoltage or logic value). An analysis program can include particularvoltage or temperature thresholds, for example, in modeling the behaviorof the cells or circuit as a whole. However, it would be apparent to oneof ordinary skill in the art that various alternative embodiments canperform method 500.

At 502 the analysis program opens (or, in some manner accesses) a sourcenetlist representing a circuit. At 504 the analysis program analyzes thesource netlist to identify equivalent cells, and at 506 the analysisprogram analyzes the source netlist to identify equivalent wires. Cells,or wires, can be logically, or functionally, equivalent in a sourcenetlist based on, for example, having the same function, being held in astatic state of operation with the same static input states, or beingclones that sink a common signal source, and other forms of equivalencesuch as described in regard to FIGS. 1A-1B, FIG. 2, FIG. 3, and FIGS. 4Aand 4B.

At 508 the analysis program combines the logically equivalent cells intoan abstract cell. As used herein, “abstract cell” refers to a cell whichrepresents a plurality of identified equivalent cells of a sourcenetlist. A reduced netlist can combine parameters of interest (e.g.,capacitance or leaking width) of each of the individual logicallyequivalent source netlist cells into a combined, or “lumped”, valueassociated with the abstract cell.

At 510 the analysis program combines the logically equivalent wiresassociated with logically equivalent cells into an abstract wire. Asused herein, “abstract wire” refers to a wire which represents aplurality of identified logically equivalent wires of a source netlist.A reduced netlist can combine the parameters of interest (e.g.,capacitance) of each of the individual logically equivalent sourcenetlist wires into a combined, or “lumped”, value associated with theabstract wire.

At 512, the analysis program forms a reduced netlist that can includethe cells and wires of the source netlist with the abstract cell (or,cells) and/or abstract wire (or, wires) substituting, in the reducednetlist, for the corresponding collective of equivalent cells and/orwires of the source netlist. For example, an embodiment can form areduced netlist in the various manners described in regard to FIGS.1A-1B, FIG. 2, FIG. 3, and FIGS. 4A and 4B.

At 514, the analysis program analyzes the reduced netlist to determinethe behavior of interest (e.g., dynamic, leakage, or short circuitpower) of the circuit represented by the source netlist. The results ofthe analysis of the reduced netlist can thereby substitute for analyzingthe larger, source netlist.

In an embodiment, the analysis program can perform the methoddynamically (e.g., “on-the-fly”), as part of analyzing (e.g., simulatinga set of inputs) a source netlist. In other embodiments, an analysisprogram (or, another program) can perform elements of the method—forexample 502 through 512, only 502 and 504, or only 502—to prepare areduced netlist, or components thereof, for a subsequent analysis.Embodiments can perform the method iteratively, for each particular setof circuit input stimuli, for example, or for a set of particular inputstimuli, and can perform the method in preparation for each simulation,or during each simulation.

FIG. 6A illustrates an example method, 600, to merge nodes and/or edgesin a source netlist that are functional equivalents and/or logicalequivalents. An embodiment can perform method 600, for example, toperform 504 and/or 506 of method 500. A combination of nodes can befunctional equivalents in that they preserve a function (e.g., inversionof a logic input to its logical compliment) across a combination ofnodes. Nodes can be logically equivalent in that they receive the sameinputs and produce the same corresponding outputs.

The method can, for example, identify and merge equivalent cells andwires (or, nodes and edges) in a source netlist in the various manners,for example, such as described in regard to FIG. 1A, FIG. 1B, and FIG.2. In a particular example, FIG. 1A, as previously described,illustrates merging across nodes, in producing reduced netlist 100B, andmerging logically-equivalent nodes, in producing reduced netlist 100C.

For purposes of illustration, but not limiting to embodiments, themethod is described as performed by a circuit analysis program, such as(for example) described in regards to method 500, and in whichelectronic components (or, books) or logic cells of a circuit are nodes,and wires are edges, in the source netlist. However, it would beapparent to one of ordinary skill in the art that various alternativeembodiments can perform method 600.

However, it would be apparent to one of ordinary skill in the art thatalternative embodiments can utilize other criteria or determinations(e.g., an electrical characteristic, a position or location within anetlist, etc.), to identify source netlist nodes and/or edges aslogically or functionally equivalent and that an embodiment other thanan analysis program can perform method 600.

At 602, the analysis program selects a start node that is connected to aroot node of a source netlist, or a sub-circuit of a source netlist, toidentify nodes and/or edges that are logically, or functionally,equivalent. For example, with reference to FIG. 1A, book 10A can be aroot node for circuit of source netlist 100A. At 602 the analysisprogram can select inverter 10B, connected to book 10A output edge, as astart node. In some embodiments, at 602 an analysis program can selectthe root node of a source netlist as a start node.

At 604 the analysis program traverses the output of the start node todetermine if it connects to a node downstream of the start node(hereinafter, “downstream node”). If there is a downstream node, at 606the analysis program determines if the downstream node has the samefunction (e.g., a logic function, such as inversion, or logical AND) asthe start node. If so, at 608 the analysis program determines if thedownstream node has the same output (e.g., logic state) as the startnode.

If, at 606, the analysis program determines that the downstream nodedoes not have the same function as the start node, or at 608 theanalysis program determines that the downstream node does not have thesame output as the start node, at 604 the analysis program selectsanother downstream node. The next downstream node can be, for example, anode connected directly in series with the current downstream node, orcan be a node connected directly to an edge that connects a plurality ofnext downstream nodes in parallel from the current downstream edge.

If, at 604, there is not another downstream node, at 616 the programoutputs the merged nodes and edges, to complete performing method 600.For example, at 616, the analysis program can form, or insert into, areduced netlist substituting the merged node and edges for thecollective, equivalent source nodes and edges. In another example, at616 the analysis program can output the abstract node and/or edge to 512of method 500 in FIG. 5. In embodiments, at 616 the program can outputlumped node and/or edge metrics associated with the merged node andedges.

If, at 606, the analysis program determines that the downstream node hasthe same function as the start node, and at 608 the analysis programdetermines that the downstream node has the same output as the startnode, at 610 the analysis program determines if it is merging across acombination of nodes or, alternatively, merging only logicallyequivalent nodes.

If merging across a combination of nodes, at 612 the program merges thecurrent downstream node, and any previously identified, or selected,downstream nodes, and their corresponding edges with the start node andits corresponding edges to form a merged (e.g., abstract) node and/ormerged (e.g., abstract) edges. In embodiments, at 612 the program canlump node and/or edge metrics of the source netlist equivalent nodesand/or edges and can associate the lumped metrics with the merged nodeand edges.

If, on the other hand, at 610 the analysis program determines it ismerging only logically equivalent nodes, at 614 the program merges thecurrent downstream node, and its corresponding edges, with the startnode and its corresponding edges to form a merged (e.g., abstract) nodeand/or merged (e.g., abstract) edges. In embodiments, at 614 the programcan lump node and/or edge metrics of the source netlist equivalent nodesand/or edges and can associate the lumped metrics with the merged nodeand edges.

At 604, the program determines whether there is another candidatedownstream node to process. If not, at 616 the program outputs themerged nodes and edges, and any corresponding lumped node and/or edgemetrics, to complete performing method 600. It would be apparent to oneof ordinary skill in that art that an embodiment can, at 610, determineto both merge across a combination of nodes, for nodes that meet thecriteria of preserving function in combination, and nodes that arelogically equivalent, for nodes that meets the criteria of logicalequivalence previously described, and to perform both 612 and 614,accordingly.

It would be further apparent to one of ordinary skill in the art thatapplication of method 600 to a source netlist can merge functionallyequivalent nodes, and/or edges, across a combination of nodes, and/ormerge logically equivalent nodes, and/or edges, in a variety ofalternative embodiments according to the illustrations of thedisclosure. For example, application of method 600 can produce a reducednetlist that merges functionally equivalent nodes across a combinationof nodes, such as to merge netlist 100A inverters 10B-10D, and edges10G-10J to produce netlist 100B of FIG. 1A, or to merge netlist 200inverters 20A-20D and edges 26A-26E of FIG. 2 to produce netlist 210. Inanother example, application of method 600, can produce a reducednetlist that merges logically equivalent nodes, such as to merge netlist100A inverters 10B and 10D, and edges 10G and 10J to produce netlist100C.

FIG. 6B illustrates an example method 630 to merge nodes and/or edges ina source netlist that can be logically equivalent as having the samestatic inputs and outputs when operating under the same conditions. Forpurposes of illustration, but not limiting to embodiments, the method isdescribed as performed by a circuit analysis program, such as theanalysis program described in reference to FIG. 6A.

At 632, the analysis program selects a start node that is connected to aroot node of a source netlist, or a sub-circuit of a source netlist, toidentify nodes and/or edges that are logically equivalent. For example,with reference to FIG. 3, control book 310 can be a root node forcircuit of source netlist 300. At 632 the analysis program can select,for example, AND gate 302, connected to control book 310 output edge312, as a start node. In some embodiments, at 632 an analysis programcan select the root node of a source netlist as a start node.

At 634 the analysis program determines whether the input(s) to the startnode and the output of the start node are the same (e.g., the samelogical “1” or “0” state). If they are the same, at 636 the programmerges the node and its input edge(s) at its output edge. For example,in FIG. 3, AND gate 302 receives logical ‘1’ at input edge 30A and 30Band outputs logical ‘1’ at its output edge 30E. Accordingly, at 632 cananalysis program can merge AND gate 302 and edges 30A, 30B, and 30E intoa single, compressed edge (not shown in FIG. 3) at edge 30E. At 638, theanalysis program combines parameters of the merged node and edges (e.g.,capacitances and/or leaking width) as parameters assigned to thecompressed edge at 30E.

If, at 634, the analysis program determines that the input(s) and outputof the node are not the same, at 640 the program determines if there isa next node in the circuit downstream of the root node. If there is anext node, the program performs 634 to 638 with regard to that node. Forexample, with referenced to netlist 300 of FIG. 3, the program canselect AND gate 304 and perform 634 to 638 to produce a compressed edge(not shown in FIG. 3) at edge 30F. Continuing with reference to FIG. 3,at 640 the program can select AND gate 306 and perform 634 to 638 toproduce a compressed edge 30G that is included in reduced netlist 320 asedge 31A, and lumping the parameters of the entire combination of nodesand edges rooted at control block edge 312, as previously described inregard to FIG. 3.

At 640, if the program determines there are no next nodes (e.g., in FIG.3, the method has merged the entire combination of nodes and edgesrooted at control block edge 312 into a single, compressed edge such as31A) the program, at 642, outputs the merged (or, compressed) node(s)and edge(s), and outputs lumped parameters associated with the mergednode(s) and edge(s). For example, at 642, the analysis program canoutput the merged node(s) and/or edge(s), and any corresponding lumpednode and/or edge metrics, to 512 of method 500 in FIG. 5.

FIG. 6C illustrates an example method 650 that can merge cloned nodesand/or edges in a source netlist that have a common source node. Forpurposes of illustration, but not limiting to embodiments, the method isdescribed as performed by a circuit analysis program, such as theanalysis program described in reference to FIG. 6A.

At 652, the analysis program selects a start node that is connected to aroot node of a source netlist, or a sub-circuit of a source netlist, toidentify nodes and/or edges that are logically equivalent. For example,with reference to FIG. 4, GCG 4A can be a root node for circuit ofsource netlist 400. At 652 the analysis program can select LCB4B,connected to GCG 4A output edge 40A, as a start node. In someembodiments, at 652 an analysis program can select the root node of asource netlist as a start node.

At 654 the program determines if there is a next node that shares theinput(s) to the start node as a common input source. For example,continuing with reference to FIG. 4, LCB 4C shares, with LCB 4B, the GCG4A output edge 40A as an input source. At 654 the analysis program canselect LCB 4C as a next node. At 656 the program determines if the startnode and the next node are clones. For example, a source netlist mayidentify nodes by a naming schema that is indicative of the nodes beinginstances of a common design book (e.g., in netlist 400, LCB 4B can benamed LCB_Book_(—01) and LCB 4C can be named LCB_Book_(—02)).

If, at 656, the program determines the nodes are clones, at 658 theprogram merges the nodes, to form a merged (e.g., abstract) node, andtheir input edges, to form a merged (e.g., abstract) edge, at the commoninput source edge. For example, continuing with reference to FIG. 4, at658 the program can merge LCBs 4B and 4C as merged node 4F, and canmerge the inputs to LCBs 4B and 4C at edge 41A, such as shown in netlist410. In embodiments, at 658 the program can lump node and/or edgemetrics of the source netlist equivalent (e.g., cloned) nodes and/oredges and can associate the lumped metrics with the merged node andedges.

If, at 656, the program determines that the start and next node are notthe same, at 654 the program determines if there is a next node thatshares the start node input source and, if so, selects that node as anew next node. Alternatively, if, at 654, the program determines thereis not a next node that shares the start node input source, at 664 theprogram outputs any merged nodes and/or edges, and outputs lumpedparameters associated with the merged node(s) and edge(s). For example,at 664, the analysis program can output the merged nodes and/or edges,and any corresponding lumped node and/or edge metrics, to 512 of method500 in FIG. 5.

At 660 the program determines whether the nodes downstream of the mergedcloned nodes are the same. The downstream nodes can be the same if theyperform the same function. For example, in FIG. 4, if latches 4D and 4Eperform the same function (e.g., latch the same number and type ofinputs and produce the same type and number of outputs), an analysisprogram can determine at 660 that the downstream nodes (e.g., latches 4Dand 4 e) are the same.

If, at 660 the program determines that the nodes downstream of themerged cloned nodes are the same, at 662 the program merges thedownstream nodes and edges, and can combine parameters of interest(e.g., capacitance and/or leaking width) of the source netlist nodes toassign to the merged node. For example, with reference to FIG. 4, at 662the program can merge netlist 400 latches 4D and 4E to form netlist 410LCB 4F, and can merge the input edges 40B and 40C to form the mergededge 41B. The program can combine parameters of interest (e.g.,capacitance and/or leaking width) of latches 4D and 4E, and edges 40Band 40C, to assign to merged latch 4F and edge 41B, respectively.

At 654, the program determines if there are additional next nodes thatare clones of the start node and, if so, performs 656 to 662 topotentially merge the next node, and potentially its downstream nodesand edges, as a new merged node and edge(s) or with any merged node andedge resulting from merging other cloned nodes in performing the method.It would be apparent to one of ordinary skill in the art that method 650an embodiment can repeat the method to select additional start nodessharing a common source.

FIG. 7 depicts a computer system, 700, according to embodiments of thepresent disclosure. Computer system 700 includes a computer 710 havingprocessors, such as processor 712 and 714. In embodiments processors canbe a single processor or a multi-threaded processor, a general purposeor a special purpose processor, a co-processor, or any of a variety ofprocessing devices that can execute computing instructions.

Computer system 700 is configured with interface 716 to enable computer710 to receive a source netlist (718), such as the source netlistdescribed in regard to FIGS. 1-7. In embodiments, the interface canenable computer 710 to receive, or otherwise access, source netlist 718via, for example, a network (e.g., an intranet, or a public network suchas the Internet), or a storage medium, such as a disk drive internal orconnected to computer 710. The interface can be human or other inputdevices, such as described later in regard to components of computer710. It would be apparent to one of ordinary skill in the art that theinterface can be any of a variety of interface types or mechanismssuitable for a computer, or a program operating in a computer, toreceive or otherwise access or receive a source netlist.

Processors included in computer 710 are connected by a memory interface750 to memory 730. In embodiments a memory can be a cache memory, a mainmemory, a flash memory, or a combination of these or other varieties ofelectronic devices capable of storing information and making theinformation, or locations storing the information within the memory,accessible to a processor. A memory can be formed of a single electronic(or, in some embodiments, other technologies such as optical) module orcan be formed of a plurality of memory modules. A memory, or a memorymodule (e.g., an electronic packaging of a portion of a memory), can be,for example, one or more silicon dies or chips, or can be a multi-chipmodule package. Embodiments can organize a memory as a sequence ofbytes, words (e.g., a plurality of contiguous or consecutive bytes), orpages (e.g., a plurality of contiguous or consecutive bytes or words).

In embodiments, a computer can include a plurality of memories. A memoryinterface, such as 750, between a processor (or, processors) and amemory (or, memories) can be, for example, a memory bus common to one ormore processors and one or more memories. In some embodiments, a memoryinterface, such as 750, between a processor and a memory can be point topoint connection between the processor and the memory, and eachprocessor in the computer can have a point-to-point connection to eachof one or more of the memories. In other embodiments, a processor (forexample, 712) can be connected to a memory (e.g., memory 730) by meansof a connection (not shown) to another processor (e.g., 714) connectedto the memory (e.g., 750 from processor 714 to memory 730).

A computer can include an IO bridge, which can be connected to a memoryinterface, or to processor (not shown). An IO bridge can interface theprocessors and/or memories of the computer (or, other IO devices) to IOdevices connected to the bridge. For example, computer 710 includes IObridge 760 interfacing memory interface 750 to IO devices, such as IOdevice 770. In some embodiments, an IO bridge can connect directly to aprocessor or a memory, or can be a component included in a processor ora memory. An IO bridge can be, for example, a PCI-Express or other IObus bridge, or can be an IO adapter.

An IO bridge can connect to IO devices by means of an IO interface, orIO bus, such as IO bus 752 of computer 710. For example, IO bus 752 canbe a PCI-Express or other IO bus. IO devices can be any of a variety ofperipheral IO devices or IO adapters connecting to peripheral IOdevices. For example, IO device 760 can be a graphic card, keyboard orother input device, a hard drive or other storage device, a networkinterface cards, etc. IO device 760 can be an IO adapter, such as aPCI-Express adapter, that connects components (e.g., processors ormemories) of a computer to IO devices (e.g., disk drives, Ethernetnetworks, video displays, keyboards, mice, etc.).

A computer can include instructions executable by one or more of theprocessors (or, processing elements, such as threads of a processor).The instructions can be a component of one or more programs. Asillustrated in the example of FIG. 7, computer 710 includes a pluralityof programs, such as program 708 and program 704. A program can be, forexample, an application program, an operating system or a function of anoperating system, or a utility or built-in function of a computer. Aprogram can be a hypervisor, and the hypervisor can manage sharingresources of the computer (e.g., a processor or regions of a memory, oraccess to an IO device) among a plurality of programs or OSes.

Programs can be “stand-alone” programs that execute on processors anduse memory within the computer directly, without requiring anotherprogram to control their execution or their use of resources of thecomputer. For example, computer 710 includes stand-alone program 708. Astand-alone program can perform particular functions within thecomputer, such as controlling, or interfacing (e.g., access by otherprograms) an IO interface or IO device. A stand-alone program can, forexample, manage the operation, or access to, a memory. A Basic I/OSubsystem (BIOS), or a computer boot program (e.g., a program that canload and initiate execution of other programs) can be a standaloneprogram.

A computer can include one or more operating systems, and an operatingsystem can control the execution of other programs such as, for example,to start or stop a program, or to manage resources of the computer usedby a program. For example, computer 710 includes operating systems(OSes) 702 and 706, each of which can include, or manage execution of,one or more programs, such as OS 702 including (or, managing) program704. In some embodiments, an operating system can function as ahypervisor.

A program can be embodied as firmware (e.g., BIOS in a desktop computer,or a hypervisor) and the firmware can execute on one or more processorsand, optionally, can use memory, included in the computer. Firmware canbe stored in a memory (e.g., a flash memory) of the computer. Forexample, computer 710 includes firmware 740 included, or stored, inmemory 730. In other embodiments, firmware can be embodied asinstructions (e.g., comprising a computer program product) on a storagemedium (e.g., a CD ROM, a flash memory, or a disk drive), and thecomputer can access the instructions from the storage medium.

In embodiments of the present disclosure, a computer program can performmethods of the disclosure to identify equivalent nodes (e.g., cells)and/or edges (e.g., wires) in a source netlist to form abstract nodesand/or abstract edges. A computer program can form a reduced netlistaccording to the embodiments of the disclosure. A computer program cancombine parameters (e.g., capacitances and/or leaking widths) ofequivalent nodes and/or edges in a source netlist, and can associate thecombined parameters with abstract nodes and/or abstract edges,respectively, in a reduced netlist.

In embodiments of the present disclosure, a computer can includeinstructions to form a reduced netlist. Computer 710 includes, forexample, reduced netlist instructions 742, which can operate to formreduced netlist 744. A computer can store the reduced netlistinstructions and/or the reduced netlist in a memory of the computer,such as computer 710 storing the reduced netlist instructions 742 andreduced netlist 744 in memory 730. A computer can obtain theinstructions, such as instructions 742, from a storage medium (e.g., aCD ROM, a flash memory, a DVD) or download the instructions from anetwork, to store in a memory, such as memory 730.

The example computer system 700 and computer 710 are not intended tolimiting to embodiments. In embodiments, computer system $00 can includea plurality of processors, interfaces, and interfaces to obtain oraccess a source netlist, and can include other elements or components,such as networks, network routers or gateways, storage systems, servercomputers, virtual computers or virtual computing and/or TO devices,cloud-computing environments, and so forth. It would be evident to oneof ordinary skill in the art to include a variety of computing devicesinterconnected in a variety of manners in a computer system embodyingaspects and features of the disclosure.

In embodiments, computer 710 can be, for example, a computing devicehaving a processor capable of executing computing instructions and,optionally, a memory in communication with the processor. For example,computer 710 can be a desktop or laptop computer; a tablet computer,mobile computing device, or cellular phone; or, a server computer, ahigh-performance computer, or a super computer. Computer 710 can be, forexample, a computing device incorporated into a wearable apparatus(e.g., an article of clothing, a wristwatch, or eyeglasses), anappliance (e.g., a refrigerator, or a lighting control), a mechanicaldevice, or (for example) a motorized vehicle. It would be apparent toone of ordinary skill in the art that a computer embodying aspects andfeatures of the disclosure can be any of a variety of computing deviceshaving processors and, optionally, memories and/or programs.

The present invention may be a system, a method, and/or a computerprogram product at any possible technical detail level of integration.The computer program product may include a computer readable storagemedium (or media) having computer readable program instructions thereonfor causing a processor to carry out aspects of the present invention,such as instructions 742.

The computer readable storage medium can be a tangible device that canretain and store instructions for use by an instruction executiondevice. The computer readable storage medium may be, for example, but isnot limited to, an electronic storage device, a magnetic storage device,an optical storage device, an electromagnetic storage device, asemiconductor storage device, or any suitable combination of theforegoing. A non-exhaustive list of more specific examples of thecomputer readable storage medium includes the following: a portablecomputer diskette, a hard disk, a random access memory (RAM), aread-only memory (ROM), an erasable programmable read-only memory (EPROMor Flash memory), a static random access memory (SRAM), a portablecompact disc read-only memory (CD-ROM), a digital versatile disk (DVD),a memory stick, a floppy disk, a mechanically encoded device such aspunch-cards or raised structures in a groove having instructionsrecorded thereon, and any suitable combination of the foregoing. Acomputer readable storage medium, as used herein, is not to be construedas being transitory signals per se, such as radio waves or other freelypropagating electromagnetic waves, electromagnetic waves propagatingthrough a waveguide or other transmission media (e.g., light pulsespassing through a fiber-optic cable), or electrical signals transmittedthrough a wire.

Computer readable program instructions described herein can bedownloaded to respective computing/processing devices from a computerreadable storage medium or to an external computer or external storagedevice via a network, for example, the Internet, a local area network, awide area network and/or a wireless network. The network may comprisecopper transmission cables, optical transmission fibers, wirelesstransmission, routers, firewalls, switches, gateway computers and/oredge servers. A network adapter card or network interface in eachcomputing/processing device receives computer readable programinstructions from the network and forwards the computer readable programinstructions for storage in a computer readable storage medium withinthe respective computing/processing device.

Computer readable program instructions for carrying out operations ofthe present invention may be assembler instructions,instruction-set-architecture (ISA) instructions, machine instructions,machine dependent instructions, microcode, firmware instructions,state-setting data, configuration data for integrated circuitry, oreither source code or object code written in any combination of one ormore programming languages, including an object oriented programminglanguage such as Smalltalk, C++, or the like, and procedural programminglanguages, such as the “C” programming language or similar programminglanguages. The computer readable program instructions may executeentirely on the user's computer, partly on the user's computer, as astand-alone software package, partly on the user's computer and partlyon a remote computer or entirely on the remote computer or server. Inthe latter scenario, the remote computer may be connected to the user'scomputer through any type of network, including a local area network(LAN) or a wide area network (WAN), or the connection may be made to anexternal computer (for example, through the Internet using an InternetService Provider). In some embodiments, electronic circuitry including,for example, programmable logic circuitry, field-programmable gatearrays (FPGA), or programmable logic arrays (PLA) may execute thecomputer readable program instructions by utilizing state information ofthe computer readable program instructions to personalize the electroniccircuitry, in order to perform aspects of the present invention.

Aspects of the present invention are described herein with reference toflowchart illustrations and/or block diagrams of methods, apparatus(systems), and computer program products according to embodiments of theinvention. It will be understood that each block of the flowchartillustrations and/or block diagrams, and combinations of blocks in theflowchart illustrations and/or block diagrams, can be implemented bycomputer readable program instructions.

These computer readable program instructions may be provided to aprocessor of a general purpose computer, special purpose computer, orother programmable data processing apparatus to produce a machine, suchthat the instructions, which execute via the processor of the computeror other programmable data processing apparatus, create means forimplementing the functions/acts specified in the flowchart and/or blockdiagram block or blocks. These computer readable program instructionsmay also be stored in a computer readable storage medium that can directa computer, a programmable data processing apparatus, and/or otherdevices to function in a particular manner, such that the computerreadable storage medium having instructions stored therein comprises anarticle of manufacture including instructions which implement aspects ofthe function/act specified in the flowchart and/or block diagram blockor blocks.

The computer readable program instructions may also be loaded onto acomputer, other programmable data processing apparatus, or other deviceto cause a series of operational steps to be performed on the computer,other programmable apparatus or other device to produce a computerimplemented process, such that the instructions which execute on thecomputer, other programmable apparatus, or other device implement thefunctions/acts specified in the flowchart and/or block diagram block orblocks.

The flowchart and block diagrams in the Figures illustrate thearchitecture, functionality, and operation of possible implementationsof systems, methods, and computer program products according to variousembodiments of the present invention. In this regard, each block in theflowchart or block diagrams may represent a module, segment, or portionof instructions, which comprises one or more executable instructions forimplementing the specified logical function(s). In some alternativeimplementations, the functions noted in the blocks may occur out of theorder noted in the Figures. For example, two blocks shown in successionmay, in fact, be executed substantially concurrently, or the blocks maysometimes be executed in the reverse order, depending upon thefunctionality involved. It will also be noted that each block of theblock diagrams and/or flowchart illustration, and combinations of blocksin the block diagrams and/or flowchart illustration, can be implementedby special purpose hardware-based systems that perform the specifiedfunctions or acts or carry out combinations of special purpose hardwareand computer instructions.

Many modifications and variations will be apparent to those of ordinaryskill in the art without departing from the scope and spirit of thedescribed embodiments. The terminology used herein is chosen to explainthe principles of the embodiments, the practical application ortechnical improvement over technologies found in the marketplace, or toenable others of ordinary skill in the art to understand the embodimentsdisclosed herein.

What is claimed is:
 1. A computer-implemented method for analyzingelectrical power in a circuit, wherein the circuit comprises a pluralityof circuit cells and a plurality of circuit wires, wherein a sourcenetlist includes a plurality of circuit nodes and a plurality circuitedges, wherein each circuit node included in the source netlistcorresponds to a circuit cell included in the circuit, wherein eachcircuit edge included in the source netlist corresponds to a wireincluded in the circuit, and wherein the method comprises: forming acompressed circuit node that combines a first circuit node and at leastone second circuit node, wherein the first circuit node and the at leastone second circuit node are included in the plurality of circuit nodesincluded in the source netlist, and wherein the forming the compressedcircuit node is based, at least in part, on the first circuit node andthe at least one second circuit node having a node equivalence; forminga first compressed circuit edge that combines a first circuit edge andat least one second circuit edge, wherein the first circuit edge and theat least one second circuit edge are included in the plurality ofcircuit edges included in the source netlist, and wherein the formingthe first compressed circuit edge is based, at least in part, on thefirst circuit edge and the at least one second circuit edge having anedge equivalence; forming a reduced netlist, wherein the reduced netlistincludes a first subset of the plurality of circuit nodes included inthe source netlist and a second subset of the plurality of circuit edgesincluded in the source netlist, wherein the reduced netlist includes thecompressed circuit node in substitution for the first circuit node andthe at least one second circuit node, and wherein the reduced netlistincludes the first compressed circuit edge in substitution for the firstcircuit edge and the at least one second circuit edge; associating withthe compressed circuit node, in the reduced netlist, a lumped nodemetric that combines a node metric associated with each of the firstcircuit node and the at least one second circuit node; associating withthe first compressed circuit edge, in the reduced netlist, a firstlumped edge metric that combines a first edge metric associated witheach of the first circuit edge and the at least one second circuit edge;and fabricating, based upon an improvement to the circuit due to a poweranalysis using the reduced netlist, a semiconductor circuit.
 2. Themethod of claim 1 further comprising: forming a second compressedcircuit edge that combines a third circuit edge and a third circuitnode, wherein the third circuit edge is selected from a first groupconsisting of the first compressed circuit edge and an at least onefourth circuit edge included in the plurality of circuit edges includedin the source netlist, wherein the third circuit node is selected from asecond group consisting of the compressed circuit node and an at leastone fourth circuit node included in the plurality of circuit nodesincluded in the source netlist, wherein the forming the secondcompressed circuit edge is based, at least in part, on the third circuitedge and the third circuit node having the same output states whenreceiving the same input states and held in a static state of operation;substituting, in the reduced netlist, the second compressed edge for thethird circuit edge and the third circuit node; and associating with thesecond compressed circuit edge, in the reduced netlist, a second lumpededge metric that combines wire capacitance associated with the thirdcircuit edge and a second edge metric associated with the third circuitnode, and wherein the second edge metric is selected from a groupconsisting of device capacitance, cross-over current capacitance, andleaking width.
 3. The method of claim 1, wherein the node equivalence isselected from a group consisting of a logical equivalence and afunctional equivalence; wherein the logical equivalence comprises thefirst circuit node and a first combination of the at least one secondcircuit node having the same operational activity, the first circuitnode and a second combination of the at least one second circuit nodehaving the same input and output states when held in a static state ofoperation, and the first circuit node and a third combination of the atleast one second circuit node being cloned nodes that receive a commonsignal source; and wherein the functional equivalence comprises thefirst circuit node and the at least one second circuit node producingthe same output states upon each of the first circuit node and the atleast one second circuit node receiving of the same input states.
 4. Themethod of claim 1, wherein the edge equivalence comprises the at leastone second circuit edge having a state equivalent to a state of thefirst circuit edge.
 5. The method of claim 1, wherein the analyzingelectrical power in a circuit comprises determining a power metricselected from the group consisting of dynamic power, leakage power, andshort-circuit power.
 6. The method of claim 1, wherein the lumped nodemetric and the node metric are selected from a group consisting ofdevice capacitance, cross-over current capacitance, and leaking width.7. The method of claim 1, wherein the first lumped edge metric and thefirst edge metric are wire capacitance.
 8. A computer program productcomprising a computer readable storage medium having programinstructions embodied therewith, wherein the program instructions areexecutable by a computing device to perform a method for analyzingelectrical power in a circuit, wherein the circuit comprises a pluralityof circuit cells and a plurality of circuit wires, wherein a sourcenetlist includes a plurality of circuit nodes and a plurality circuitedges, wherein each circuit node included in the source netlistcorresponds to a circuit cell included in the circuit, wherein eachcircuit edge included in the source netlist corresponds to a wireincluded in the circuit, and wherein the method comprises: forming acompressed circuit node that combines a first circuit node and at leastone second circuit node, wherein the first circuit node and the at leastone second circuit node are included in the source netlist, and whereinthe forming the compressed circuit node is based, at least in part, onthe first circuit node and the at least one second circuit node having anode equivalence; forming a first compressed circuit edge that combinesa first circuit edge and at least one second circuit edge, wherein thefirst circuit edge and the at least one second circuit edge are includedin the plurality of circuit nodes included in the source netlist, andwherein the forming the first compressed circuit edge is based, at leastin part, on the first circuit edge and the at least one second circuitedge having an edge equivalence; forming a reduced netlist, wherein thereduced netlist includes a first subset of the plurality of circuitnodes included in the source netlist and a second subset of theplurality of circuit edges included in the source netlist, wherein thereduced netlist includes the compressed circuit node in substitution forthe first circuit node and the at least one second circuit node, andwherein the reduced netlist includes the first compressed circuit edgein substitution for the first circuit edge and the at least one secondcircuit edge; associating with the compressed circuit node, in thereduced netlist, a lumped node metric that combines a node metricassociated with each of the first circuit node and the at least onesecond circuit node; associating with the first compressed circuit edge,in the reduced netlist, a first lumped edge metric that combines a firstedge metric associated with each of the first circuit edge and the atleast one second circuit edge; and fabricating, based upon animprovement to the circuit due to a power analysis using the reducednetlist, a semiconductor circuit.
 9. The computer program product ofclaim 8, the method further comprising: forming a second compressedcircuit edge that combines a third circuit edge and a third circuitnode, wherein the third circuit edge is selected from a first groupconsisting of the first compressed circuit edge and an at least onefourth circuit edge included in the plurality of circuit edges, whereinthe third circuit node is selected from a second group consisting of thecompressed circuit node and an at least one fourth circuit node includedin the plurality of circuit nodes, wherein the forming the secondcompressed circuit edge is based, at least in part, on the third circuitedge and the third circuit node having the same output states whenreceiving the same input states and held in a static state of operation;substituting, in the reduced netlist, the second compressed edge for thethird circuit edge and the third circuit node; and associating with thesecond compressed circuit edge, in the reduced netlist, a second lumpededge metric that combines wire capacitance associated with the thirdcircuit edge and a second edge metric associated with the third circuitnode, and wherein the second edge metric is selected from a groupconsisting of device capacitance, cross-over current capacitance, andleaking width.
 10. The computer program product of claim 8, wherein thenode equivalence is selected from a group consisting of a logicalequivalence and a functional equivalence; wherein the logicalequivalence comprises the first circuit node and a first combination ofthe at least one second circuit node having the same operationalactivity, the first circuit node and a second combination of the atleast one second circuit node having the same input and output stateswhen held in a static state of operation, and the first circuit node anda third combination of the at least one second circuit node being clonednodes that receive a common signal source; and wherein the functionalequivalence comprises the first circuit node and the at least one secondcircuit node producing the same output states upon each of the firstcircuit node and the at least one second circuit node receiving of thesame input states.
 11. The computer program product of claim 8, whereinthe edge equivalence comprises the at least one second circuit edgehaving a state equivalent to a state of the first circuit edge.
 12. Thecomputer program product of claim 8, wherein the analyzing electricalpower in a circuit comprises determining a power metric selected fromthe group consisting of dynamic power, leakage power, and short-circuitpower.
 13. The computer program product of claim 8, wherein the lumpednode metric and the node metric are selected from a group consisting ofdevice capacitance, cross-over current capacitance, and leaking width.14. The computer program product of claim 8, wherein the first lumpededge metric and the first edge metric are wire capacitance.
 15. Acomputer system for analyzing a circuit, wherein the circuit comprises aplurality of circuit cells and a plurality of circuit wires, and whereinthe computer system comprises: a source netlist, wherein the sourcenetlist includes a plurality of circuit nodes and a plurality circuitedges, wherein each circuit node included in the source netlistcorresponds to a circuit cell included in the circuit, wherein eachcircuit edge included in the source netlist corresponds to a wireincluded in the circuit; an interface to receive the source netlist; anda processor coupled to the interface, wherein the processor isconfigured to execute instructions to receive the source netlist,wherein the processor is configured to execute instructions to analyzeelectrical power in the circuit, wherein the instructions are,optionally, stored in a memory communicatively coupled to the processor,and wherein the processor executing the instructions to analyzeelectrical power in the circuit comprises: forming a compressed circuitnode that combines a first circuit node and at least one second circuitnode, wherein the first circuit node and the at least one second circuitnode are included in the plurality of circuit nodes included in thesource netlist, and wherein the forming the compressed circuit node isbased, at least in part, on the first circuit node and the at least onesecond circuit node having a node equivalence; forming a firstcompressed circuit edge that combines a first circuit edge and at leastone second circuit edge, wherein the first circuit edge and the at leastone second circuit edge are included in the plurality of circuit edgesincluded in the source netlist, and wherein the forming the firstcompressed circuit edge is based, at least in part, on the first circuitedge and the at least one second circuit edge having an edgeequivalence; forming a reduced netlist, wherein the reduced netlistincludes a first subset of the plurality of circuit nodes included inthe source netlist and a second subset of the plurality of circuit edgesincluded in the source netlist, wherein the reduced netlist includes thecompressed circuit node in substitution for the first circuit node andthe at least one second circuit node, wherein the reduced netlistincludes the first compressed circuit edge in substitution for the firstcircuit edge and the at least one second circuit edge, and wherein thereduced netlist is, optionally, stored in the memory; associating withthe compressed circuit node, in the reduced netlist, a lumped nodemetric that combines a node metric associated with each of the firstcircuit node and the at least one second circuit node; associating withthe first compressed circuit edge, in the reduced netlist, a firstlumped edge metric that combines a first edge metric associated witheach of the first circuit edge and the at least one second circuit edge;and fabricating, based upon an improvement to the circuit due to a poweranalysis using the reduced netlist, a semiconductor circuit.
 16. Thecomputer system of claim 15, wherein the processor executing theinstructions to analyze electrical power in the circuit furthercomprises: forming a second compressed circuit edge that combines athird circuit edge and a third circuit node, wherein the third circuitedge is selected from a first group consisting of the first compressedcircuit edge and an at least one fourth circuit edge included in theplurality of circuit edges, wherein the third circuit node is selectedfrom a second group consisting of the compressed circuit node and an atleast one fourth circuit node included in the plurality of circuitnodes, wherein the forming the second compressed circuit edge is based,at least in part, on the third circuit edge and the third circuit nodehaving the same output states when receiving the same input states andheld in a static state of operation; substituting, in the reducednetlist, the second compressed edge for the third circuit edge and thethird circuit node; and associating with the second compressed circuitedge, in the reduced netlist, a second lumped edge metric that combineswire capacitance associated with the third circuit edge and a secondedge metric associated with the third circuit node, and wherein thesecond edge metric is selected from a group consisting of devicecapacitance, cross-over current capacitance, and leaking width.
 17. Thecomputer system of claim 15, wherein the node equivalence is selectedfrom a group consisting of a logical equivalence and a functionalequivalence; wherein the logical equivalence comprises the first circuitnode and a first combination of the at least one second circuit nodehaving the same operational activity, the first circuit node and asecond combination of the at least one second circuit node having thesame input and output states when held in a static state of operation,and the first circuit node and a third combination of the at least onesecond circuit node being cloned nodes that receive a common signalsource; and wherein the functional equivalence comprises the firstcircuit node and the at least one second circuit node producing the sameoutput states upon each of the first circuit node and the at least onesecond circuit node receiving of the same input states.
 18. The computersystem of claim 15, wherein the edge equivalence comprises the at leastone second circuit edge having a state equivalent to a state of thefirst circuit edge.
 19. The computer system of claim 15, wherein theanalyzing the electrical power in the circuit comprises determining apower metric selected from the group consisting of dynamic power,leakage power, and short-circuit power.
 20. The computer system of claim15, wherein the lumped node metric and the node metric are selected froma group consisting of device capacitance, cross-over currentcapacitance, and leaking width, and wherein the first lumped edge metricand the first edge metric are wire capacitance.